NOISE MEASUREMENTS IN ELECTRON-BEAM-EVAPORATED AMORPHOUS SILICON THIN-FILMS

被引：2

|

作者：

NEUDECK, GW

KRIEGEL, MH

机构：

来源：

THIN SOLID FILMS | 1978年 / 53卷 / 02期

关键词：

D O I：

10.1016/0040-6090(78)90037-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：209 / 215

页数：7

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