TEMPERATURE STABILITY OF PUNCH-THROUGH DIODES

被引：0
|
作者：
COGAN, DD
VANDEROER, TG
机构：
[1] DEPT ELECTR & ELECT ENGN,BIRMINGHAM B15 2TT,ENGLAND
[2] EINDHOVEN UNIV TECHNOL,EINDHOVEN,NETHERLANDS
来源：
SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：897 / 900
页数：4
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