COMPARISON OF STEP COVERAGE AND OTHER ASPECTS OF THE H2/WF6 AND SIH4/WF6 REDUCTION SCHEMES USED IN BLANKET LPCVD OF TUNGSTEN

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作者
SCHMITZ, JEJ [1 ]
VANDIJK, AJM [1 ]
GRAEF, MWM [1 ]
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[1] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS
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O646 [电化学、电解、磁化学];
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081704 ;
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页码:C477 / C477
页数:1
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