INTERFACIAL ATOMIC-STRUCTURE AND BAND OFFSETS AT SEMICONDUCTOR HETEROJUNCTIONS

被引:73
作者
DANDREA, RG [1 ]
DUKE, CB [1 ]
ZUNGER, A [1 ]
机构
[1] NATL RENEWABLE ENERGY LAB, GOLDEN, CO 80401 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 04期
关键词
D O I
10.1116/1.586234
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The relationship between interfacial atomic structure and band offsets at semiconductor heterojunctions is explored through first-principles local density functional calculations. In particular, the effects of variations in interfacial geometry are analyzed for (001) interfaces between III-V/III-V materials. For the AC/BC case of a common atom, isovalent A-B intermixing in the noncommon atomic planes near the interface does not affect the band offset, even in the case of large lattice-mismatched systems. For quaternary AB/CD systems, there are two possible chemically abrupt interfaces (A-D or B-C); these can have offsets that differ by up to 80 meV. In those cases where the chemically abrupt AB/CD offset depends on the interfacial identity, intermixing leads to offset variations which are directly related to the offset difference between the chemically abrupt A-D and B-C interfaces. The differing behavior of common-atom versus noncommon-atom systems is analyzed in terms of the symmetry of the nearest-neighbor environment surrounding an atomic site of a composition change.
引用
收藏
页码:1744 / 1753
页数:10
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