CHEMICAL-ANALYSIS OF SURFACE BY FLUORESCENT X-RAY SPECTROSCOPY USING RHEED-SSD METHOD

被引：49
作者：
INO, S
ICHIKAWA, T
OKADA, S
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1980年 / 19卷 / 08期
关键词：
D O I：
10.1143/JJAP.19.1451
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：1451 / 1457
页数：7
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