Determination of constitution diagrams with x-rays

被引：1
作者：
Barrett, CS
机构：
[1] Carnegie Inst technol, Met Res Lab, Pittsburgh, PA USA
[2] Carnegie Inst technol, Dept Met, Pittsburgh, PA USA
来源：
JOURNAL OF APPLIED PHYSICS | 1941年 / 12卷 / 05期
关键词：
D O I：
10.1063/1.1712916
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：385 / 394
页数：10
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