THE EFFECT OF PROFILE STEP WIDTH ON THE DETERMINATION OF CRYSTAL-STRUCTURE PARAMETERS AND ESTIMATED STANDARD DEVIATIONS BY X-RAY RIETVELD ANALYSIS

被引：58
作者：
HILL, RJ
MADSEN, IC
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1986年 / 19卷
关键词：
D O I：
10.1107/S0021889886090076
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：10 / 18
页数：9
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