ANALYSIS OF COMPOSITE X-RAY DIFFRACTION PROFILES

被引：4

|

作者：

SLADE, JJ

NANNI, LF

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1960年 / 31卷 / 04期

关键词：

D O I：

10.1063/1.1735672

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：699 / 706

页数：8

相关论文

共 50 条

[1] OPERATIONAL UNFOLDING OF COMPOSITE X-RAY DIFFRACTION PROFILES
SLADE, JJ
NANNI, LF
ACTA CRYSTALLOGRAPHICA, 1960, 13 (12): : 1062 - 1062
[2] ANALYSIS OF REFLEX PROFILES IN X-RAY DIFFRACTION
GONSCHOR.W
HAHN, T
ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1970, 132 (4-6): : 430 - &
[3] HOOK EFFECT IN ANALYSIS OF X-RAY DIFFRACTION LINE PROFILES
AGNIHOTRI, OP
NATURE, 1964, 203 (494) : 177 - &
[4] ANALYSIS OF X-RAY DIFFRACTION LINE PROFILES OF MICROCRYSTALLINE MUSCOVITES
KODAMA, H
GATINEAU, L
MERING, J
CLAYS AND CLAY MINERALS, 1971, 19 (06) : 405 - &
[5] Fourier transformation of X-ray diffraction profiles
Liu, Gang
Liang, Zhide
Lu, Ke
Jinshu Xuebao/Acta Metallurgica Sinica, 2002, 38 (01):
[6] The Fourier transformation of X-ray diffraction profiles
Liu, G
Liang, ZD
Lu, K
ACTA METALLURGICA SINICA, 2002, 38 (01) : 109 - 112
[7] Analysis of the broadening of X-ray diffraction line profiles of polycrystalline tungsten
Trubin, V.A., 1600, (125):
[8] Modeling and analysis of X-ray diffraction profiles using solid nanocrystals
Audebrand, N
Louër, D
JOURNAL DE PHYSIQUE IV, 1998, 8 (P5): : 109 - 118
[9] APPLICATION OF VARIANCE METHOD TO THE ANALYSIS OF X-RAY DIFFRACTION PROFILES FOR POLYMER
Mu Xiangqi
Hu Hengliang
ACTA PHYSICO-CHIMICA SINICA, 1986, 2 (03) : 224 - 228
[10] X-RAY DIFFRACTION ANALYSIS BY FLUORESCENT X-RAY APPARATUS
YONEDA, M
JAPAN ANALYST, 1970, 19 (11): : 1559 - &

← 1 2 3 4 5 →