COHERENT MEASUREMENT OF THZ OPTICAL RECTIFICATION FROM ELECTROOPTIC CRYSTALS

被引：162
作者：
ZHANG, XC
JIN, Y
MA, XF
机构：
[1] Department of Physics, Rensselaer Polytechnic Institute, Troy
来源：
APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 23期
关键词：
D O I：
10.1063/1.108083
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report the results of coherent measurement (phase and amplitude) of optical rectification from a variety of electro-optic crystals. We also present a comparison of the experimental data with a theoretical calculation.
引用
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页码：2764 / 2766
页数：3
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