共 11 条
X-RAY CHARACTERIZATION OF INXGA1-XAS/GAAS QUANTUM WELLS
被引:10
作者:

JEONG, J
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SCHLESINGER, TE
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MILNES, AG
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关键词:
D O I:
10.1016/0022-0248(88)90174-1
中图分类号:
O7 [晶体学];
学科分类号:
0702 ;
070205 ;
0703 ;
080501 ;
摘要:
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页码:265 / 275
页数:11
相关论文
共 11 条
[1]
OPTICAL CHARACTERIZATION OF PSEUDOMORPHIC INXGA1-XAS-GAAS SINGLE-QUANTUM-WELL HETEROSTRUCTURES
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ANDERSON, NG
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LAIDIG, WD
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KOLBAS, RM
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LO, YC
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ORGANOMETALLIC VAPOR-PHASE EPITAXIAL-GROWTH AND CHARACTERIZATION OF HIGH-PURITY GAINAS ON INP
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THE INTERPRETATION OF X-RAY ROCKING CURVES FROM III-V SEMICONDUCTOR-DEVICE STRUCTURES
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JOURNAL OF CRYSTAL GROWTH,
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HALLIWELL, MAG
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h-index: 0
机构:
UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND

LYONS, MH
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND

HILL, MJ
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND
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X-RAY STUDY OF MISFIT STRAIN RELAXATION IN LATTICE-MISMATCHED HETEROJUNCTIONS
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APPLIED PHYSICS LETTERS,
1986, 49 (17)
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KAMIGAKI, K
论文数: 0 引用数: 0
h-index: 0

SAKASHITA, H
论文数: 0 引用数: 0
h-index: 0

KATO, H
论文数: 0 引用数: 0
h-index: 0

NAKAYAMA, M
论文数: 0 引用数: 0
h-index: 0

SANO, N
论文数: 0 引用数: 0
h-index: 0

TERAUCHI, H
论文数: 0 引用数: 0
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[6]
SOME ASPECTS OF THE X-RAY STRUCTURAL CHARACTERIZATION OF (GA1-XALXAS)N1(GAAS)N2 GAAS(001) SUPERLATTICES
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1984, 17 (JUN)
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KERVAREC, J
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

BAUDET, M
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

CAULET, J
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

AUVRAY, P
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

EMERY, JY
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

REGRENY, A
论文数: 0 引用数: 0
h-index: 0
机构: Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr
[7]
X-RAY DOUBLE-CRYSTAL CHARACTERIZATION OF HIGHLY PERFECT INGAAS INP GROWN BY VAPOR-PHASE EPITAXY
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MACRANDER, AT
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JOURNAL OF APPLIED PHYSICS,
1986, 59 (02)
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MACRANDER, AT
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STREGE, KE
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[8]
GROWTH-CONDITIONS AND CHARACTERIZATION OF INGAAS GAAS STRAINED LAYERS SUPERLATTICES
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QUILLEC, M
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JOURNAL OF APPLIED PHYSICS,
1984, 55 (08)
:2904-2909

QUILLEC, M
论文数: 0 引用数: 0
h-index: 0

GOLDSTEIN, L
论文数: 0 引用数: 0
h-index: 0

LEROUX, G
论文数: 0 引用数: 0
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BURGEAT, J
论文数: 0 引用数: 0
h-index: 0

PRIMOT, J
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h-index: 0
[9]
X-RAY PENDELLOSUNG IN GARNET EPITAXIAL LAYERS
[J].
STACY, WT
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JOURNAL OF CRYSTAL GROWTH,
1974, 27 (DEC)
:282-286

STACY, WT
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

JANSSEN, MM
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
[10]
ATOMISTIC MODELS OF INTERFACE STRUCTURES OF GAAS-ALXGA1-XAS (X=0.2-1) QUANTUM-WELLS GROWN BY INTERRUPTED AND UNINTERRUPTED MBE
[J].
TANAKA, M
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SAKAKI, H
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JOURNAL OF CRYSTAL GROWTH,
1987, 81 (1-4)
:153-158

论文数: 引用数:
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SAKAKI, H
论文数: 0 引用数: 0
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机构: Univ of Tokyo, Tokyo, Jpn, Univ of Tokyo, Tokyo, Jpn