DERIVATION OF MINIMAL TEST SETS FOR MONOTONIC LOGIC CIRCUITS

被引：7

作者：

DANDAPANI, R ^{[1
]}

机构：

[1] UNIV IOWA, DEPT COMP SCI, IOWA CITY, IA 52240 USA

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1973年 / C 22卷 / 07期

关键词：

D O I：

10.1109/TC.1973.5009131

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：657 / 661

页数：5

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