MOLECULAR-WEIGHT DISTRIBUTIONS OF POLYMERS USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY

被引:76
作者
BLETSOS, IV
HERCULES, DM
VANLEYEN, D
HAGENHOFF, B
NIEHUIS, E
BENNINGHOVEN, A
机构
[1] UNIV PITTSBURGH,DEPT CHEM,PITTSBURGH,PA 15260
[2] UNIV MUNSTER,INST PHYS,W-4400 MUNSTER,GERMANY
关键词
D O I
10.1021/ac00018a011
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Molecular weight distributions of well-defined polymers (e.g., polystyrenes, perfluorinated polyethers, etc.) were obtained from time-of-flight secondary-ion mass spectra. Number and weight average molecular weights calculated from the spectra are reproducible (relative standard deviation = 0.5-8%) and in good agreement (ca. +/- 10%) with values determined by conventional techniques (e.g., gel permeation chromatography, nuclear magnetic resonance spectroscopy, etc.). The mass resolution Ml DELTA-M = 1000) and detection efficiency of the instrument may bias molecular weight distributions toward low values, but this can be corrected by using high-resolution spectra and calibrating the detector. Disappearance cross sections of oligomers provide a measure of the effect of sputtering on the accuracy of molecular weight distributions; they are a function of polymer type, and increase with oligomer size. Number average molecular weights of polystyrenes (MW = 1000-5000) are altered by approximately 1-5% due to sputtering due the time required to obtain a spectrum.
引用
收藏
页码:1953 / 1960
页数:8
相关论文
共 44 条
[1]  
[Anonymous], MACROMOLECULES
[2]  
BENNINGHOVEN A, 1987, SECONDARY ION MASS S, V86, P671
[3]  
BENNINGHOVEN A, 1970, CHEM PHYS LETT, V6, P616
[4]  
Billmeyer FW, 1957, TXB POLYM SCI
[5]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY - DETECTION OF FRAGMENTS FROM THICK POLYMER-FILMS IN THE RANGE M/Z-LESS-THAN-OR-EQUAL-TO-4500 [J].
BLETSOS, IV ;
HERCULES, DM ;
MAGILL, JH ;
VANLEYEN, D ;
NIEHUIS, E ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1988, 60 (09) :938-944
[6]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMERS IN THE MASS RANGE 500-10000 [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A .
MACROMOLECULES, 1987, 20 (02) :407-413
[7]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF NYLONS - DETECTION OF HIGH MASS FRAGMENTS [J].
BLETSOS, IV ;
HERCULES, DM ;
GREIFENDORF, D ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1985, 57 (12) :2384-2388
[8]   STRUCTURAL CHARACTERIZATION OF MODEL POLYESTER POLYURETHANES USING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A ;
KARAKATSANIS, CG ;
RIECK, JN .
MACROMOLECULES, 1990, 23 (18) :4157-4163
[9]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF PERFLUORINATED POLYETHERS [J].
BLETSOS, IV ;
HERCULES, DM ;
FOWLER, D ;
VANLEYEN, D ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1990, 62 (13) :1275-1284
[10]   STRUCTURAL CHARACTERIZATION OF MODEL POLYURETHANES USING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A ;
KARAKATSANIS, CG ;
RIECK, JN .
ANALYTICAL CHEMISTRY, 1989, 61 (19) :2142-2149