SCHOTTKY-BARRIER CAPACITANCE MEASUREMENTS FOR DEEP LEVEL IMPURITY DETERMINATION

被引：84

作者：

BLEICHER, M ^{[1
]}

LANGE, E ^{[1
]}

机构：

[1] TECH UNIV MUNICH, INST TECH ELEKTR, MUNICH 8, WEST GERMANY

来源：

SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 03期

关键词：

D O I：

10.1016/0038-1101(73)90012-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：375 / 380

页数：6

共 10 条

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