ELECTROFORMING AND DIELECTRIC BREAKDOWN IN THIN ALUMINUM-OXIDE FILMS

被引:18
作者
MORGAN, DV [1 ]
HOWES, MJ [1 ]
POLLARD, RD [1 ]
WATERS, DGP [1 ]
机构
[1] UNIV LEEDS,DEPT ELECT & ELECTR ENG,LEEDS,YORKSHIRE,ENGLAND
关键词
D O I
10.1016/0040-6090(73)90210-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:123 / 131
页数:9
相关论文
共 50 条
[41]   LUMINESCENCE OF ALUMINUM-OXIDE FILMS IN AN ELECTROLYTIC CELL [J].
MIKHO, VV ;
DENISOVA, GM .
SOVIET ELECTROCHEMISTRY, 1990, 26 (06) :715-718
[42]   DIELECTRIC SPECTRUM OF WATER ADSORBED BY ANODIC ALUMINUM-OXIDE [J].
SEITMAGZIMOV, AA ;
PAK, VN .
JOURNAL OF APPLIED CHEMISTRY OF THE USSR, 1989, 62 (07) :1531-1533
[43]   ALUMINUM-OXIDE THIN-FILMS PREPARED BY CHEMICAL VAPOR-DEPOSITION FROM ALUMINUM ACETYLACETONATE [J].
MARUYAMA, T ;
ARAI, S .
APPLIED PHYSICS LETTERS, 1992, 60 (03) :322-323
[44]   SPECTROPHOTOMETRIC DETERMINATION OF ALUMINUM IN MULTICOMPONENT FILMS ON ALUMINUM-OXIDE SUBSTRATES [J].
SHAKHVERDI, NM ;
NAUMOVA, ON ;
TUMANOV, AA .
INDUSTRIAL LABORATORY, 1989, 55 (03) :250-253
[45]   DIELECTRIC POLARIZATION OF MAGNESIUM-DOPED ALUMINUM-OXIDE [J].
VILA, R ;
DECASTRO, MJ .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1991, 119 :609-614
[46]   Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy [J].
Magtoto, NP ;
Niu, C ;
Ekstrom, BM ;
Addepalli, S ;
Kelber, JA .
APPLIED PHYSICS LETTERS, 2000, 77 (14) :2228-2230
[47]   KINETICS OF THE FORMATION OF THIN-FILMS OF ALUMINUM-OXIDE IN A LOW-TEMPERATURE PLASMA [J].
SZCZEKLIK, J ;
SCHABOWSKA, E .
THIN SOLID FILMS, 1980, 71 (01) :L17-L19
[48]   THIN-FILMS OF (3-AMINOPROPYL)TRIETHOXYSILANE ON ALUMINUM-OXIDE AND GOLD SUBSTRATES [J].
KURTH, DG ;
BEIN, T .
LANGMUIR, 1995, 11 (08) :3061-3067
[49]   ELECTRICAL BREAKDOWN IN THIN DIELECTRIC FILMS [J].
FORLANI, F ;
MINNAJA, N .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04) :518-+
[50]   ELECTRICAL BREAKDOWN IN THIN DIELECTRIC FILMS [J].
KLEIN, N .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) :963-+