GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTORS BY ION-IMPLANTATION

被引:27
作者
WELCH, BM [1 ]
EISEN, FH [1 ]
HIGGINS, JA [1 ]
机构
[1] ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
关键词
D O I
10.1063/1.1663838
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:3685 / 3687
页数:3
相关论文
共 13 条
[1]  
BECHTEL NG, 1970, IEEE J SOLID STATE C, VSC 5, P319
[2]  
EISEN FH, 1973, 3 P INT ION IMPL C
[3]   EFFICIENT DOPING OF GAAS BY SE+ ION IMPLANTATION [J].
FOYT, AG ;
DONNELLY, JP ;
LINDLEY, WT .
APPLIED PHYSICS LETTERS, 1969, 14 (12) :372-&
[4]   INFLUENCE OF IMPLANTATION TEMPERATURE AND SURFACE PROTECTION ON TELLURIUM IMPLANTATION IN GAAS [J].
HARRIS, JS ;
MAYER, JW ;
EISEN, FH ;
HASKELL, JD ;
WELCH, B ;
PASHLEY, RD .
APPLIED PHYSICS LETTERS, 1972, 21 (12) :601-&
[5]  
Hunsperger R. G., 1970, Radiation Effects, V6, P263, DOI 10.1080/00337577008236305
[6]   GAAS FIELD-EFFECT TRANSISTORS WITH ION-IMPLANTED CHANNELS [J].
HUNSPERGER, RG ;
HIRSCH, N .
ELECTRONICS LETTERS, 1973, 9 (25) :577-578
[7]  
PASHLEY RM, UNPUBLISHED
[8]   THEORY OF AN EXPERIMENT FOR MEASURING THE MOBILITY AND DENSITY OF CARRIERS IN THE SPACE-CHARGE REGION OF A SEMICONDUCTOR SURFACE [J].
PETRITZ, RL .
PHYSICAL REVIEW, 1958, 110 (06) :1254-1262
[9]  
Sansbury J. D., 1970, Radiation Effects, V6, P269, DOI 10.1080/00337577008236306
[10]  
STERZER F, 1971, ELECTRON LETT, V7, P21