THE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE IN THE REFLECTIVITY AT THE K EDGE OF CU

被引：52

作者：

MARTENS, G

RABE, P

机构：

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1981年 / 14卷 / 10期

关键词：

D O I：

10.1088/0022-3719/14/10/020

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：1523 / 1534

页数：12

共 13 条

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION
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CREMONESEVISICATO, M
ONORI, G
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4439 - 4445
[2] Beckmann P., 1967, PROGR OPTICS, V6, P53
[3] EXAFS AND SURFACE EXAFS FROM MEASUREMENTS OF X-RAY REFLECTIVITY
FOX, R
GURMAN, SJ
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (11): : L249 - L253
[4] FUKAMACHI T, 1978, JAP J APPL PHYS S, P326
[5] KAWAMURA T, 1978, JAP J APPL PHYS S, P224
[6] Kiessig H, 1931, ANN PHYS-BERLIN, V10, P715
[7] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS
MARTENS, G
RABE, P
SCHWENTNER, N
WERNER, A
[J]. PHYSICAL REVIEW B, 1978, 17 (04): : 1481 - 1488
[8] THE ANOMALOUS DISPERSION OF THE REFRACTIVE-INDEX AND THE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE AT THE K EDGE OF CU
MARTENS, G
RABE, P
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (31): : L913 - L918
[9] EXAFS OF A THIN-FILM OF CU MEASURED BY TOTAL REFLECTION
MARTENS, G
RABE, P
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 57 (01): : K31 - K34
[10] EXAFS STUDIES ON SUPERFICIAL REGIONS BY MEANS OF TOTAL REFLECTION
MARTENS, G
RABE, P
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 58 (02): : 415 - 424