THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE

被引：220
作者：
ENNOS, AE
机构：
来源：
BRITISH JOURNAL OF APPLIED PHYSICS | 1953年 / 4卷 / APR期
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D O I：
10.1088/0508-3443/4/4/302
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：101 / 106
页数：6
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