SURVEY OF CORROSION FAILURE MECHANISMS IN MICROELECTRONIC DEVICES

被引：0
|
作者：
SCHNABLE, GL
COMIZZOLI, RB
KERN, W
WHITE, LK
机构：
来源：
RCA REVIEW | 1979年 / 40卷 / 04期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：416 / 445
页数：30
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