SENSITIVITY OF OPTICAL DATA PROCESSING TO CHANGES IN ROCK FABRIC .2. STANDARDIZED GRAIN PATTERNS

被引：7

作者：

PINCUS, HJ

机构：

[1] Twin Cities Mining Research Center, U.S. Bureau of Mines, Minneapolis, Minn., Present address: Department of Geology, University of Wisconsin, Milwaukee.

来源：

INTERNATIONAL JOURNAL OF ROCK MECHANICS AND MINING SCIENCES | 1969年 / 6卷 / 03期

关键词：

D O I：

10.1016/0148-9062(69)90003-5

中图分类号：

P5 [地质学];

学科分类号：

0709 ; 081803 ;

摘要：

Standardized grain patterns have been used as input test data to evaluate the sensitivity of optical data processing to changes in fabric. Differences in grain size for untwinned, flat etch inputs and twinned, contrast etch inputs can be detected between successive members in two ASTM standard series. When applied to half-tone inputs, the maximum spatial frequencies of ODP inputs should not be larger than one-fifth the spatial frequency of the half-tone screen. © 1969.

引用

页码：269 / &