ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS USING A NEW DYNAMICAL INTERFERENCE EFFECT

被引:36
作者
HART, M
MILNE, AD
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D O I
10.1107/S056773947000058X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
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页码:223 / &
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[1]   X-RAY DYNAMICAL CONTRAST OF A PLANAR DEFECT [J].
AUTHIER, A ;
MILNE, AD ;
SAUVAGE, M .
PHYSICA STATUS SOLIDI, 1968, 26 (02) :469-&
[2]   THEORIE DER AUSBREITUNG VON RONTGEN-WELLENFELDSTRAHLEN IM SCHWACH DEFORMIERTEN KRISTALLGITTER [J].
BONSE, U .
ZEITSCHRIFT FUR PHYSIK, 1964, 177 (04) :385-&
[3]   *DIE ABSORPTION VON RONTGENSTRAHLEN IM FALL DER INTERFERENZ [J].
BORRMANN, G .
ZEITSCHRIFT FUR PHYSIK, 1950, 127 (04) :297-323
[4]   COVALENT BOND IN SILICON [J].
DAWSON, B .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455) :379-&
[5]   A GENERAL STRUCTURE FACTOR FORMALISM FOR INTERPRETING ACCURATE X-RAY AND NEUTRON DIFFRACTION DATA [J].
DAWSON, B .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1454) :255-&
[6]   AN ACCURATE ABSOLUTE SCATTERING FACTOR FOR SILICON [J].
HART, M ;
MILNE, AD .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :134-&
[7]   To the dispersion theory of X-rays. [J].
Hoenl, H. .
ZEITSCHRIFT FUR PHYSIK, 1933, 84 (1-2) :1-16
[8]  
Honl H, 1933, ANN PHYS-BERLIN, V18, P625
[10]   A THEORETICAL STUDY OF PENDELLOSUNG FRINGES .1. GENERAL CONSIDERATIONS [J].
KATO, N .
ACTA CRYSTALLOGRAPHICA, 1961, 14 (05) :526-&