FRICTIONAL EFFECTS IN ATOMIC-FORCE MICROSCOPY OF LANGMUIR-BLODGETT-FILMS

被引：0

作者：

TENGROTENHUIS, E

VANMILTENBURG, JC

VANDEREERDEN, JP

机构：

来源：

SCANNING | 1995年 / 17卷 / 03期

关键词：

ATOMIC FORCE MICROSCOPY; FRICTION; LANGMUIR-BLODGETT FILMS;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Frictional effects in atomic force microscopy (AFM) of Langmuir-Blodgett films of 1,2-dipalmitoyl-sn-glycero-phosphoglycerol were examined. Height measurements of the Langmuir layers are strongly influenced by the orientation of the cantilevers used in AFM relative to the sample. A simple model is used to describe the frictional effects and to calculate the real height of the monolayers.

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页码：192 / 195

页数：4

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