RADIATION-DAMAGE OF BIPOLAR SST DUE TO FAST-NEUTRONS

被引:6
作者
IKEDA, H
UJIIE, N
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D O I
10.1016/0168-9002(89)91484-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:508 / 511
页数:4
相关论文
共 6 条
  • [1] GILCHRIESE MGD, 1988, RAD EFFECTS SSC
  • [2] GROOM DE, 1988, RAD LEVELS SSC INTER
  • [3] MONOLITHIC PREAMPLIFIER WITH BIPOLAR SST FOR SILICON STRIP READOUT
    IKEDA, H
    UJIIE, N
    AKAZAWA, Y
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (01) : 502 - 506
  • [4] KONAKA S, 1984, 16TH P C SOL STAT DE, P209
  • [5] MESSENGER GC, 1986, EFFECTS RAD ELECTRON, P183
  • [6] HIGH-SPEED AND PRECISE MONOLITHIC MULTIPLIER WITH RADIATION HARDNESS USING SILICON BIPOLAR SST
    UMEHIRA, M
    KIKUCHI, H
    KONAKA, S
    KATO, S
    [J]. ELECTRONICS LETTERS, 1986, 22 (14) : 744 - 746