A SHRINKAGE TESTIMATOR FOR SCALE PARAMETER OF AN EXPONENTIAL-DISTRIBUTION

被引：4

作者：

PANDEY, BN ^{[1
]}

SRIVASTAVA, R ^{[1
]}

机构：

[1] BANARAS HINDU UNIV,VARANASI 221005,UTTAR PRADESH,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1987年 / 27卷 / 06期

关键词：

D O I：

10.1016/0026-2714(87)90757-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：949 / 951

页数：3

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