Studies in interferometry - II. The construction, testing and use of reflection echelons for the visible and ultra-violet regions

被引：25
作者：
Williams, WE
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来源：
PROCEEDINGS OF THE PHYSICAL SOCIETY | 1933年 / 45卷
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D O I：
10.1088/0959-5309/45/5/308
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：699 / 726
页数：29
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