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- [4] Computational scanning electron microscopy FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007, 2007, 931 : 512 - +
- [5] Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron Microscopy JOURNAL OF SURFACE INVESTIGATION, 2023, 17 (06): : 1422 - 1438
- [6] Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron Microscopy Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2023, 17 : 1422 - 1438