SOME MODIFICATIONS OF SCANNING ELECTRON MICROSCOPE FOR USE IN ELECTRON CHANNELLING PATTERNS OBSERVATION

被引：5
作者：
VICARIO, E
PITAVAL, M
UZAN, R
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1970年 / 3卷 / 04期
关键词：
D O I：
10.1088/0022-3735/3/4/425
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：323 / &
相关论文
共 7 条
[1]   SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].
BOOKER, GR ;
SHAW, AMB ;
WHELAN, MJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&
[2]   Secondary electron emission Part II. Absorption of secondary electrons [J].
Bruining, H .
PHYSICA, 1938, 5 :901-912
[3]   KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].
COATES, DG .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&
[4]   OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].
SCHULSON, EM ;
VANESSEN, CG .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :247-&
[5]   FURTHER COMMENTS ON ORIGIN OF ORIENTATION-DEPENDENT PATTERNS OBTAINED IN SCANNING ELECTRON MICROSCOPE [J].
SHAW, AMB ;
BOOKER, GR ;
COATES, DG .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :243-&
[6]  
VANNIEUWENHUYZE F, 1969, CR ACAD SCI B PHYS, V268, P1409
[7]  
VICARIO E, 1969, CR ACAD SCI B PHYS, V269, P287
1