PRINCIPLES OF ION-BEAM WELDING

被引：0
|
作者：
PATON, BE
NAZARENKO, OK
GABOVICH, MD
SOLOSHENKO, IA
机构：
[1] EO PATON WELDING INST, KIEV, UKRAINE
[2] ACAD SCI USSR, PHYS INST, KHARKOV, UKRAINE
来源：
AUTOMATIC WELDING USSR | 1973年 / 26卷 / 10期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：1 / 4
页数：4
相关论文
共 50 条
  • [31] ION-BEAM INSTRUMENTATION SIMULATOR AS A TOOL FOR ANALYZING AND DESIGNING ION-BEAM SYSTEMS
    HICKS, WW
    KELLER, JH
    BENNER, RH
    WINNARD, JR
    PUZAK, TR
    SCHMIDT, S
    NUCLEAR INSTRUMENTS & METHODS, 1976, 139 (DEC15): : 25 - 31
  • [32] PROFILE CONTROL BY CHEMICALLY ASSISTED ION-BEAM AND REACTIVE ION-BEAM ETCHING
    CHINN, JD
    ADESIDA, I
    WOLF, ED
    APPLIED PHYSICS LETTERS, 1983, 43 (02) : 185 - 187
  • [33] VISUAL ION-BEAM IMAGES PRODUCED BY ELECTRON AND ION-BEAM INTERACTION ON SURFACES
    FINE, J
    GORDEN, R
    JOURNAL OF APPLIED PHYSICS, 1978, 49 (03) : 1236 - 1240
  • [34] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS
    CHU, WK
    MAYER, JW
    NICOLET, MA
    BUCK, TM
    AMSEL, G
    EISEN, F
    THIN SOLID FILMS, 1973, 17 (01) : 1 - 41
  • [35] Extinction of large droplets in ion-beam ablation plasma produced by ion-beam evaporation
    Shishido, H
    Yanagi, H
    Kawahara, H
    Suzuki, T
    Yunogami, T
    Suematsu, H
    Jiang, WH
    Yatsui, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (1B): : 698 - 700
  • [36] THE MECHANISMS OF ION-BEAM MODIFICATION OF PMMA FOR DRY ETCH DEVELOPMENT ION-BEAM LITHOGRAPHY
    BEALE, MIJ
    BROUGHTON, C
    PIDDUCK, AJ
    DESHMUKH, VGI
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 19-20 : 995 - 1000
  • [37] ION-BEAM LITHOGRAPHY - AN INVESTIGATION OF RESOLUTION LIMITS AND SENSITIVITIES OF ION-BEAM EXPOSED PMMA
    KARAPIPERIS, L
    DUBREUIL, D
    DAVID, P
    DIEUMEGARD, D
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 353 - 357
  • [38] ION-BEAM ASSISTED MASKLESS ETCHING OF GAAS BY 50 KEV FOCUSED ION-BEAM
    GAMO, K
    OCHIAI, Y
    NAMBA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (12): : L792 - L794
  • [39] ION-BEAM THERMOGRAPHY - ANALYSIS OF CHEMICAL-COMPOUNDS USING ION-BEAM TECHNIQUES
    MARTINSSON, BG
    HANSSON, HC
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 34 (02): : 203 - 208
  • [40] ION-BEAM ASSISTED ETCHING OF GAAS BY LOW-ENERGY FOCUSED ION-BEAM
    KOSUGI, T
    GAMO, K
    NAMBA, S
    AIHARA, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (05): : 2660 - 2663
12345