SIMPLE METHOD FOR MEASURING THE LINEWIDTH ENHANCEMENT FACTOR OF SEMICONDUCTOR-LASERS BY OPTICAL-INJECTION LOCKING

被引：20
作者：
IIYAMA, K
HAYASHI, K
IDA, Y
机构：
[1] Department of Electrical and Computer Engineering, Faculty of Technology, Kanazawa University, Kanazawa, 920
来源：
OPTICS LETTERS | 1992年 / 17卷 / 16期
关键词：
D O I：
10.1364/OL.17.001128
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A simple method for measuring the linewidth enhancement factor a of a semiconductor laser by optical injection locking is described. Without knowledge of the absolute values of detuning and the optical injection level, the value of alpha is evaluated from only changes in optical power in the stable optical injection-locking state. The value of alpha of a 0.83-mu-m channeled substrate planar laser is evaluated to be 2.65 +/- 0.2. The measurement error of this method is also discussed.
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页码：1128 / 1130
页数：3
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