ANALYTICAL INSTRUMENTATION FOR ELECTRON-ENERGY LOSS SPECTROSCOPY AND APPLICATIONS

被引：0

作者：

GELLER, JD ^{[1
]}

机构：

[1] JEOL USA INC,MEDFORD,MA 02155

来源：

MICROSCOPE | 1978年 / 26卷 / 04期

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中图分类号：

TH742 [显微镜];

学科分类号：

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页码：224 / 224

页数：1

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