DESIGN OF A 90-DEGREE SPHERICAL DEFLECTION ANALYZER

被引：4

作者：

ROSS, AW

SMITH, LK

XIE, CD

THUESEN, LH

FINK, M

WELLENSTEIN, HF

机构：

[1] UNIV TEXAS, DEPT PHYS, AUSTIN, TX 78712 USA

[2] SNOW COLL, DEPT PHYS, EPHRAIM, UT 84627 USA

[3] SHANXI UNIV, DEPT PHYS, TAIYUAN 030006, PEOPLES R CHINA

[4] BRANDEIS UNIV, DEPT PHYS, WALTHAM, MA 02254 USA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1994年 / 69卷 / 03期

基金：

美国国家科学基金会;

关键词：

EQUIPMENT; FRINGE FIELD; INSTRUMENT; NOVEL; SDA-90;

D O I：

10.1016/0368-2048(94)02199-A

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Ray tracing calculations have been performed for a 90 degree spherical deflection analyzer taking into account realistic fringe fields. The results are compared with previous results which used approximations to account for the fringe fields' effects. A new mode of operation, which leads to higher resolution of the analyzer, was found and is discussed in detail.

引用

页码：189 / 195

页数：7