DESIGN OF A 90-DEGREE SPHERICAL DEFLECTION ANALYZER

被引：4
|
作者：
ROSS, AW
SMITH, LK
XIE, CD
THUESEN, LH
FINK, M
WELLENSTEIN, HF
机构：
[1] UNIV TEXAS, DEPT PHYS, AUSTIN, TX 78712 USA
[2] SNOW COLL, DEPT PHYS, EPHRAIM, UT 84627 USA
[3] SHANXI UNIV, DEPT PHYS, TAIYUAN 030006, PEOPLES R CHINA
[4] BRANDEIS UNIV, DEPT PHYS, WALTHAM, MA 02254 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1994年 / 69卷 / 03期
基金：
美国国家科学基金会;
关键词：
EQUIPMENT; FRINGE FIELD; INSTRUMENT; NOVEL; SDA-90;
D O I：
10.1016/0368-2048(94)02199-A
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Ray tracing calculations have been performed for a 90 degree spherical deflection analyzer taking into account realistic fringe fields. The results are compared with previous results which used approximations to account for the fringe fields' effects. A new mode of operation, which leads to higher resolution of the analyzer, was found and is discussed in detail.
引用
收藏
页码：189 / 195
页数：7
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