DIFFRACTION COEFFICIENTS AND FIELD PATTERNS OF OBTUSE ANGLE DIELECTRIC WEDGE ILLUMINATED BY E-POLARIZED PLANE-WAVE

被引:2
|
作者
KIM, SY
机构
[1] Applied Electronics Laboratory, Korea Institute of Science and Technology, Cheongryang, Seoul
关键词
D O I
10.1109/8.202721
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The diffraction problem is treated for the incidence of an E-Polarized plane wave on both interfaces of an obtuse-angled dielectric wedge. Based on the dual integral equation, the total field is obtained by sum of the physical optics solution and the edge-diffracted correction term. Calculated diffraction coefficients and field patterns are plotted in figures for wedge angle 120-degrees, incident angles 60-degrees and 70-degrees, and relative dielectric constants 2 and 10. It is shown that the Neumann expansion to the nonuniform currents provides a more accurate correction to the physical optics currents than the multipole expansion as the angle of dielectric wedge increases.
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页码:1427 / 1431
页数:5
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