ENVIRONMENTAL DEGRADATION OF ALXGA1-XAS-GAAS QUANTUM-WELL HETEROSTRUCTURES

被引:48
作者
DALLESASSE, JM
ELZEIN, N
HOLONYAK, N
HSIEH, KC
BURNHAM, RD
DUPUIS, RD
机构
[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
[2] AMOCO RES & DEV,NAPERVILLE,IL 60566
[3] UNIV TEXAS,AUSTIN,TX 78712
关键词
D O I
10.1063/1.346527
中图分类号
O59 [应用物理学];
学科分类号
摘要
Data describing the deterioration of AlxGa1 -xAs-GaAs heterostructures in long-term exposure (2-12 years) to normal room environmental conditions (∼20-25 °C, varying humidity) are presented. Optical microscopy, scanning electron microscopy, transmission electron microscopy, and electron dispersion x-ray spectroscopy are used to examine AlxGa1-xAs-GaAs quantum-well heterostructure material that has hydrolyzed at cleaved edges, cracks, and fissures, and at pinholes in cap layers. The hydrolysis is found to be significant for thicker (>0.1 μm) AlxGa1 -xAs layers of higher composition (x>0.85).
引用
收藏
页码:2235 / 2238
页数:4
相关论文
共 9 条
[1]  
ALFEROV ZI, 1970, SOV PHYS SEMICOND, V3, P1107
[2]  
CRAFORD MG, COMMUNICATION
[3]   STABILITY OF ALAS IN ALXGA1-XAS-ALAS-GAAS QUANTUM-WELL HETEROSTRUCTURES [J].
DALLESASSE, JM ;
GAVRILOVIC, P ;
HOLONYAK, N ;
KALISKI, RW ;
NAM, DW ;
VESELY, EJ ;
BURNHAM, RD .
APPLIED PHYSICS LETTERS, 1990, 56 (24) :2436-2438
[4]   HIGH-EFFICIENCY GAALAS-GAAS HETEROSTRUCTURE SOLAR-CELLS GROWN BY METALLO-ORGANIC CHEMICAL VAPOR-DEPOSITION [J].
DUPUIS, RD ;
DAPKUS, PD ;
YINGLING, RD ;
MOUDY, LA .
APPLIED PHYSICS LETTERS, 1977, 31 (03) :201-203
[5]  
DUPUIS RD, 1979, 7TH P INT S GAAS REL, P1
[6]   LOW-THRESHOLD CONTINUOUS LASER OPERATION (300-337-DEGREES-K) OF MULTILAYER MO-CVD ALXGA1-XAS-GAAS QUANTUM-WELL HETEROSTRUCTURES [J].
HOLONYAK, N ;
KOLBAS, RM ;
LAIDIG, WD ;
VOJAK, BA ;
DUPUIS, RD ;
DAPKUS, PD .
APPLIED PHYSICS LETTERS, 1978, 33 (08) :737-739
[7]   HIGH-PERFORMANCE SOLAR CELL MATERIAL - NORMAL-ALAS-PARA-GAAS PREPARED BY VAPOR-PHASE EPITAXY [J].
JOHNSTON, WD ;
CALLAHAN, WM .
APPLIED PHYSICS LETTERS, 1976, 28 (03) :150-152
[8]  
POURBAIX M, 1973, LECTURES ELECTROCHEM, P145
[9]  
Pourbaix M., 1966, ATLAS ELECTROCHEMICA, P168