PLANE-WAVE X-RAY TOPOGRAPHIC STUDIES ON VARIOUS KINDS OF DISLOCATIONS IN SILICON

被引：0
|
作者：
KOHRA, K [1 ]
MATSUSHITA, T [1 ]
ISHIDA, H [1 ]
ISHIKAWA, T [1 ]
机构：
[1] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1978年 / 34卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：S257 / S258
页数：2
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