RAPID THERMAL ANNEALING OF BE+-IMPLANTED IN0.52AL0.48AS

被引:4
作者
LEE, W [1 ]
FONSTAD, CG [1 ]
机构
[1] MIT, CTR MAT SCI & ENGN, CAMBRIDGE, MA 02139 USA
关键词
D O I
10.1063/1.338262
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:5272 / 5278
页数:7
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