CORRECTION OF INSTRUMENTAL ABERRATION - EXPERIMENTAL CRITERIA FOR UTILIZATION OF DECONVOLUTION METHODS

被引：16

作者：

CROCHE, R ^{[1
]}

GATINEAU, L ^{[1
]}

机构：

[1] CNRS,CTR RECH SOLIDES ORGANISAT CRISTALLINE IMPARFAITE,F-45045 ORLEANS,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1977年 / 10卷 / DEC期

关键词：

D O I：

10.1107/S0021889877014009

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：479 / 485

页数：7

共 39 条

[1] True and apparent intensity distribution in spectral lines [J].

Burger, H. C. ;

van Cittert, P. H. .

ZEITSCHRIFT FUR PHYSIK, 1933, 81 (7-8) :428-434

[2] True and apparent intensity distribution in spectral lines. [J].

Burger, H. C. ;

van Cittert, P. H. .

ZEITSCHRIFT FUR PHYSIK, 1932, 79 (11-12) :722-730

[3]

CROCHE R, 1975, THESIS PARIS

[4] DIRECT METHOD FOR UNFOLDING CONVOLUTION PRODUCTS - ITS APPLICATION TO X-RAY SCATTERING INTENSITIES [J].

ERGUN, S .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :19-&

[5] OPTIMUM DECONVOLUTION TECHNIQUE FOR A FABRY-PEROT-INTERFEROMETER TO DETERMINE TRUE SPECTRAL PROFILES AND PRECISE ATOMIC DENSITY [J].

KAMINISHI, K ;

NAWATA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (10) :1640-1652

[6] NEW METHOD FOR DECONVOLUTING CODED APERTURE IMAGES OF 3 DIMENSIONAL X-RAY OBJECTS [J].

KLOTZ, E ;

LINDE, R ;

WEISS, H .

OPTICS COMMUNICATIONS, 1974, 12 (02) :183-187

[7] AUTOMATED DECONVOLUTION OF PATTERSON SYNTHESIS BY MEANS OF A MODIFIED VECTOR-VERIFICATION METHOD - APPLICATION TO SOME HEAVY-ATOM PATTERSON FUNCTIONS [J].

LENSTRA, ATH ;

SCHOONE, JC .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (JUL1) :419-423

[8] DIRECT METHOD FOR CORRECTION OF PROFILES OF X-RAY-DIFFRACTION LINES .3. RESEARCH ON OPTIMUM SOLUTION IN DECONVOLUTION [J].

LOUBOUTIN, R ;

LOUER, D .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, A 28 (SEP1) :396-+

[9] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .1. NUMERIC DECONVOLUTION METHOD [J].

LOUER, D ;

WEIGEL, D ;

LOUBOUTI.R .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :335-&

[10] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .2. EFFECT OF RECEPTOR SLIT ON REGISTRATION OF AN X-RAY DIFFRACTION LINE PROFILE [J].

LOUER, D ;

WEIGEL, D .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :338-&

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