VACUUM-TIGHT SAMPLE HOLDER FOR HIGH TEMPERATURE CONDUCTIVITY MEASUREMENTS

被引：2
|
作者：
FRIAUF, RJ
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1960年 / 31卷 / 10期
关键词：
D O I：
10.1063/1.1716840
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1161 / 1163
页数：3
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