CHANNELED-PROTON-INDUCED X-RAY MEASUREMENTS OF RADIATION-DAMAGE IN SAPPHIRE

被引:8
作者
LUERA, TF
机构
关键词
D O I
10.1063/1.327536
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:5792 / 5796
页数:5
相关论文
共 12 条
[1]   ULTRAHIGH-VACUUM SYSTEM FOR ION-INDUCED CHARACTERISTIC X-RAY ANALYSIS [J].
BEEZHOLD, W .
THIN SOLID FILMS, 1973, 19 (02) :387-397
[2]   ION IMPLANTATION INTO INSULATORS - CHARGE-REMOVAL STUDIES USING ION-INDUCED CHARACTERISTIC X-RAYS [J].
BEEZHOLD, W ;
EERNISSE, EP .
APPLIED PHYSICS LETTERS, 1972, 21 (12) :592-&
[3]  
BRICE DK, 1975, ION IMPLANTATION RAN
[4]   CHANNELING IN DIATOMIC CRYSTALS - HE IONS IN ALPHA-AL2O3 [J].
CARNERA, A ;
DELLAMEA, G ;
DRIGO, AV ;
LORUSSO, S ;
MAZZOLDI, P ;
HARTLEY, NEW .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1978, 35 (04) :201-208
[5]  
EISEN FH, 1973, CHANNELING, P415
[6]   EFFECT OF IONIZING-RADIATION ON DISPLACEMENT DAMAGE IN ION-BOMBARDED SINGLE-CRYSTAL ALPHA-AL203 AND ALPHA-SIO2 [J].
KREFFT, GB ;
BEEZHOLD, W ;
EERNISSE, EP .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) :2247-2249
[7]   VOLUME EXPANSION AND ANNEALING COMPACTION OF ION-BOMBARDED SINGLE-CRYSTAL AND POLYCRYSTALLINE ALPHA-AL2O3 [J].
KREFFT, GB ;
EERNISSE, EP .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (05) :2725-2730
[8]  
LUERA TF, 1976, ION IMPLANTATION SEM, P285
[9]  
LUERA TF, 1979, THESIS U NEW MEXICO
[10]  
REUTER FW, 1970, THESIS U CALIFORNIA