SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER

被引：207

作者：

IIDA, A ^{[1
]}

KOHRA, K ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,TOKYO 113,JAPAN

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 51卷 / 02期

关键词：

D O I：

10.1002/pssa.2210510227

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The kinematical and dynamical components of diffracted X‐rays from perfect and mechanically damaged silicon single crystals are separately measured in the vicinity of the reciprocal lattice point using a triple crystal arrangement of (+n, −n, +n) setting. In the case of a perfect erystal, besides the normal dynamical diffraction, a broad and weak hump due to the lattice vibration is observed at the scattering vector deviation as small as 2 × 103 cm−1. For crystals with lapped and scratched surface a noticeable change of the intensity curves, i.e. a change of the equal‐intensity contour in the reciprocal space, is observed. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA

引用

页码：533 / 542

页数：10

共 15 条

[1] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].