AUTOMATIC-MEASUREMENT OF PENETRATION DEPTH IN SUPERCONDUCTORS USING MINIPROCESSOR

被引：0

|

作者：

IMFELD, NJ ^{[1
]}

EGLOFF, C ^{[1
]}

RINDERER, L ^{[1
]}

机构：

[1] UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND

来源：

HELVETICA PHYSICA ACTA | 1978年 / 51卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：455 / 455

页数：1

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