AUTOMATIC-MEASUREMENT OF PENETRATION DEPTH IN SUPERCONDUCTORS USING MINIPROCESSOR

被引：0
|
作者：
IMFELD, NJ [1 ]
EGLOFF, C [1 ]
RINDERER, L [1 ]
机构：
[1] UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND
来源：
HELVETICA PHYSICA ACTA | 1978年 / 51卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：455 / 455
页数：1
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