RELIABILITY OF PLANAR INGAAS/INP PHOTODIODES PASSIVATED WITH BORO-PHOSPHO-SILICATE GLASS

被引：1
|
作者：
MARTINELLI, RU
ENSTROM, RE
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 01期
关键词：
D O I：
10.1063/1.340454
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：250 / 252
页数：3
相关论文
共 44 条
  • [1] DARK CURRENT DRIFT MECHANISMS ON PLANAR INGAAS/INP PHOTODIODES PASSIVATED BY SINX
    DUCROQUET, F
    GUILLOT, G
    NOUAILHAT, A
    RENAUD, JC
    REVUE DE PHYSIQUE APPLIQUEE, 1989, 24 (01): : 57 - 63
  • [2] Ge-doped Boro-Phospho-Silicate Glass Micro-lens Array Produced by Thermal Reflow
    Jeong, Jin-ho
    Oh, Jin-Gyeong
    Choi, Jun-Seok
    Choi, Gi-Seon
    Lee, Hyeong-Jong
    Bae, Byeong-Seong
    KOREAN JOURNAL OF OPTICS AND PHOTONICS, 2005, 16 (04) : 340 - 344
  • [3] Reliability testing of single diffused planar InP/InGaAs avalanche photodiodes
    Jung, J
    Kwon, YH
    Hyun, KS
    Yun, I
    TWENTY SEVENTH ANNUAL IEEE/CPMT/SEMI INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, 2002, : 193 - 194
  • [4] Reliability of planar InP-InGaAs avalanche photodiodes with recess etching
    Jung, JH
    Kwon, YH
    Hyun, KS
    Yun, I
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2002, 14 (08) : 1160 - 1162
  • [5] INP/INGAASP/INGAAS PLANAR AVALANCHE PHOTODIODES
    MIKAWA, T
    KANEDA, T
    NAKAJIMA, K
    JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS, 1984, 11 : 68 - 83
  • [6] A RELIABILITY METHODOLOGY APPLIED TO VERY HIGH-RELIABILITY PLANAR INGAAS/INP PIN PHOTODIODES
    SUTHERLAND, RR
    SKRIMSHIRE, CP
    ROBERTSON, MJ
    BRITISH TELECOM TECHNOLOGY JOURNAL, 1989, 7 (01): : 69 - 77
  • [7] Photoresponse uniformity in planar InP/InGaAs avalanche photodiodes
    Walker, A. W.
    Pitts, O. J.
    2021 INTERNATIONAL CONFERENCE ON NUMERICAL SIMULATION OF OPTOELECTRONIC DEVICES (NUSOD), 2021, : 41 - 42
  • [8] Planar photodiodes FPA of heteroepitaxial structure InGaAs/InP
    Orion RandP Association, 46/2 Enthusiasts highway, Moscow, 111123, Russia
    Appl. Phys., 1 (47-52):
  • [9] HIGH BANDWIDTH PLANAR INP/INGAAS AVALANCHE PHOTODIODES
    EKHOLM, DT
    GEARY, JM
    HOLLENHORST, JN
    MATTERA, VD
    PAWELEK, R
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (12) : 2434 - 2434
  • [10] RELIABILITY OF MESA AND PLANAR INGAAS PIN PHOTODIODES
    SKRIMSHIRE, CP
    FARR, JR
    SLOAN, DF
    ROBERTSON, MJ
    PUTLAND, PA
    STOKOE, JCD
    SUTHERLAND, RR
    IEE PROCEEDINGS-J OPTOELECTRONICS, 1990, 137 (01): : 74 - 78
12345