SPATIAL-RESOLUTION AND DETECTION SENSITIVITY IN MICROANALYSIS BY ELECTRON-ENERGY LOSS SELECTED IMAGING

被引：63

作者：

ADAMSONSHARPE, KM ^{[1
]}

OTTENSMEYER, FP ^{[1
]}

机构：

[1] ONTARIO CANC INST,TORONTO M4X 1K9,ONTARIO,CANADA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 122卷 / JUN期

关键词：

D O I：

10.1111/j.1365-2818.1981.tb01271.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：309 / 314

页数：6

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