APPLICATIONS OF TANDEM SCANNING REFLECTED LIGHT-MICROSCOPY AND 3-DIMENSIONAL IMAGING

被引：32
作者：
BOYDE, A
机构：
来源：
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES | 1986年 / 483卷
关键词：
D O I：
10.1111/j.1749-6632.1986.tb34553.x
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
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页码：428 / 439
页数：12
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