ELLIPSOMETRIC MEASUREMENTS ON THERMALLY EVAPORATED THIN-FILMS

被引:0
作者
HILTON, JW [1 ]
HILTON, WA [1 ]
机构
[1] WILLIAM JEWELL COLL,DEPT PHYS,LIBERTY,MO 64068
关键词
D O I
10.1119/1.1987333
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
引用
收藏
页码:702 / 705
页数:4
相关论文
共 50 条
  • [31] DETERMINATION OF THICKNESS AND OPTICAL-CONSTANTS OF THIN-FILMS FROM PHOTOMETRIC AND ELLIPSOMETRIC MEASUREMENTS
    ELIZALDE, E
    FRIGERIO, JM
    RIVORY, J
    APPLIED OPTICS, 1986, 25 (24) : 4557 - 4561
  • [32] ABSORPTION BISTABILITY IN EVAPORATED ZNSEX THIN-FILMS
    KUMMROW, A
    EICHLER, HJ
    APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1989, 49 (06): : 497 - 502
  • [33] VACUUM EVAPORATED THIN-FILMS FOR SOLAR COLLECTORS
    FLORDAL, LE
    KIVAISI, R
    VACUUM, 1977, 27 (04) : 399 - 402
  • [34] CHARACTERIZATION OF REACTIVELY EVAPORATED SIOX THIN-FILMS
    OLEARY, MJ
    THOMAS, JH
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (01): : 106 - 109
  • [35] CRYSTALLIZATION OF FLASH EVAPORATED THIN-FILMS OF INSE
    HASHIMOTO, H
    NISHIMURA, H
    SUZUKI, H
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (06) : 1163 - 1164
  • [36] COMPOSITION CONTROL FOR EVAPORATED COCR THIN-FILMS
    HONDA, K
    TOHMA, K
    SUGITA, R
    SAKAMOTO, Y
    IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (03) : 2612 - 2616
  • [37] STRUCTURE OF EVAPORATED BISMUTH OXIDE THIN-FILMS
    MEDERNACH, JW
    JOURNAL OF SOLID STATE CHEMISTRY, 1975, 15 (04) : 352 - 359
  • [38] OPTICAL PROPERTIES OF SPUTTERED AND EVAPORATED THIN-FILMS
    KRIKORIA.E
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 391 - &
  • [39] ABSORPTION BISTABILITY AND NONLINEARITY IN EVAPORATED THIN-FILMS
    EICHLER, HJ
    HAASE, A
    JANIAK, K
    KUMMROW, A
    WAHI, A
    WAPPELT, A
    OPTICS COMMUNICATIONS, 1992, 88 (4-6) : 298 - 304
  • [40] TEM STUDY OF EVAPORATED COCR THIN-FILMS
    MISIAK, J
    TYMOSZ, T
    ACTA PHYSICA POLONICA A, 1990, 78 (05) : 725 - &