首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
CONTROL OF RF SPUTTERED FILM PROPERTIES THROUGH SUBSTRATE TUNING
被引:78
作者
:
LOGAN, JS
论文数:
0
引用数:
0
h-index:
0
LOGAN, JS
机构
:
来源
:
IBM JOURNAL OF RESEARCH AND DEVELOPMENT
|
1970年
/ 14卷
/ 02期
关键词
:
D O I
:
10.1147/rd.142.0172
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:172 / &
相关论文
共 8 条
[1]
BUTLER HS, 1961, 820 STANF U REP
[2]
APPLICATION OF RF DISCHARGES TO SPUTTERING
[J].
KOENIG, HR
论文数:
0
引用数:
0
h-index:
0
KOENIG, HR
;
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:168
-&
[3]
RE-EMISSION OF SPUTTERED SIO2 DURING GROWTH AND ITS RELATION TO FILM QUALITY
[J].
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
;
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
;
STANDLEY, CL
论文数:
0
引用数:
0
h-index:
0
STANDLEY, CL
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:176
-&
[4]
THIN FILMS DEPOSITED BY BIAS SPUTTERING
[J].
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
;
SCHAIBLE, PM
论文数:
0
引用数:
0
h-index:
0
SCHAIBLE, PM
.
JOURNAL OF APPLIED PHYSICS,
1965,
36
(01)
:237
-&
[5]
PROPERTIES OF INSULATING THIN FILMS DEPOSITED BY RF SPUTTERING
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
DAVIDSE, PD
论文数:
0
引用数:
0
h-index:
0
DAVIDSE, PD
;
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
;
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1967,
11
(04)
:461
-&
[6]
EVIDENCE FOR OXIDATION GROWTH AT THE OXIDE-SILICON INTERFACE FROM CONTROLLED ETCH STUDIES
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
GNALL, RP
论文数:
0
引用数:
0
h-index:
0
GNALL, RP
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(07)
:872
-873
[7]
ARGON CONTENT OF SIO2 FILMS DEPOSITED BY RF SPUTTERING IN ARGON
[J].
SCHWARTZ, GC
论文数:
0
引用数:
0
h-index:
0
SCHWARTZ, GC
;
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(01)
:52
-&
[8]
GAS INCORPORATION INTO SPUTTERED FILMS
[J].
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
;
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
.
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
:3928
-&
←
1
→
共 8 条
[1]
BUTLER HS, 1961, 820 STANF U REP
[2]
APPLICATION OF RF DISCHARGES TO SPUTTERING
[J].
KOENIG, HR
论文数:
0
引用数:
0
h-index:
0
KOENIG, HR
;
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:168
-&
[3]
RE-EMISSION OF SPUTTERED SIO2 DURING GROWTH AND ITS RELATION TO FILM QUALITY
[J].
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
;
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
;
STANDLEY, CL
论文数:
0
引用数:
0
h-index:
0
STANDLEY, CL
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:176
-&
[4]
THIN FILMS DEPOSITED BY BIAS SPUTTERING
[J].
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
;
SCHAIBLE, PM
论文数:
0
引用数:
0
h-index:
0
SCHAIBLE, PM
.
JOURNAL OF APPLIED PHYSICS,
1965,
36
(01)
:237
-&
[5]
PROPERTIES OF INSULATING THIN FILMS DEPOSITED BY RF SPUTTERING
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
DAVIDSE, PD
论文数:
0
引用数:
0
h-index:
0
DAVIDSE, PD
;
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
;
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1967,
11
(04)
:461
-&
[6]
EVIDENCE FOR OXIDATION GROWTH AT THE OXIDE-SILICON INTERFACE FROM CONTROLLED ETCH STUDIES
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
GNALL, RP
论文数:
0
引用数:
0
h-index:
0
GNALL, RP
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(07)
:872
-873
[7]
ARGON CONTENT OF SIO2 FILMS DEPOSITED BY RF SPUTTERING IN ARGON
[J].
SCHWARTZ, GC
论文数:
0
引用数:
0
h-index:
0
SCHWARTZ, GC
;
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(01)
:52
-&
[8]
GAS INCORPORATION INTO SPUTTERED FILMS
[J].
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
;
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
.
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
:3928
-&
←
1
→