INVESTIGATION OF PROCESS LATITUDE FOR QUALITY IMPROVEMENT IN X-RAY-LITHOGRAPHY MASK FABRICATION

被引:2
作者
TRUBE, J
CHLEBEK, J
GRIMM, J
HUBER, HL
LOCHEL, B
STAUCH, H
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1990年 / 8卷 / 06期
关键词
D O I
10.1116/1.585123
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Statistical methods are applied to improve the quality of fabrication steps in x-ray mask production. A second-order central composite design was used to optimize the bonding procedure in the mask blank preparation. The computer-controlled bonding process delivers 4-in. mask blanks with a flatness in the range of 2-4-mu-m. Factorial design as an optimizing method was applied to improve the quality of gold absorber patterns. The dependence of surface roughness of pulse plated structures on switch-on time, duty cycle, and current was investigated. Using optimized parameters, an improvement of lateral homogeneity and a decrease of grain size was achieved.
引用
收藏
页码:1600 / 1603
页数:4
相关论文
共 6 条
[1]  
BOX GEP, 1978, STATISTICS EXPT
[2]  
KO WH, 1985, MICROMACHINING MICRO
[3]  
Lochel B., 1990, Microelectronic Engineering, V11, P279, DOI 10.1016/0167-9317(90)90115-A
[4]  
PUIPPE JC, 1990, PULSE PLATING
[5]  
REID F, 1982, GOLD ALS OBERFLACHE, P70
[6]  
STATGRAFICS STATISTI