SMALL-ANGLE X-RAY AND NEUTRON-SCATTERING STUDIES OF PLASMA-DEPOSITED AMORPHOUS SILICON-HYDROGEN FILMS

被引：44

作者：

LEADBETTER, AJ

RASHID, AAM

RICHARDSON, RM

WRIGHT, AF

KNIGHTS, JC

机构：

[1] RUTHERFORD HIGH ENERGY LAB,CHILTON OX11 0QX,OXFORDSHIRE,ENGLAND

[2] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

[3] ILL GRENOBLE,F-38042 GRENOBLE,FRANCE

来源：

SOLID STATE COMMUNICATIONS | 1980年 / 33卷 / 09期

关键词：

D O I：

10.1016/0038-1098(80)90293-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：973 / 977

页数：5

共 6 条

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[2]

IBEL K, NEUTRON BEAM FACILIT

[3] MICROSTRUCTURE OF PLASMA-DEPOSITED A-SI-H FILMS [J].

KNIGHTS, JC ;

LUJAN, RA .

APPLIED PHYSICS LETTERS, 1979, 35 (03) :244-246

[4] STRUCTURAL INTERPRETATION OF THE VIBRATIONAL-SPECTRA OF A-SI-H ALLOYS [J].

LUCOVSKY, G ;

NEMANICH, RJ ;

KNIGHTS, JC .

PHYSICAL REVIEW B, 1979, 19 (04) :2064-2073

[5] LUMINESCENCE STUDIES OF PLASMA-DEPOSITED HYDROGENATED SILICON [J].

STREET, RA ;

KNIGHTS, JC ;

BIEGELSEN, DK .

PHYSICAL REVIEW B, 1978, 18 (04) :1880-1891

[6] EFFECT OF ANNEALING ON THE OPTICAL-PROPERTIES OF PLASMA DEPOSITED AMORPHOUS HYDROGENATED SILICON [J].

TSAI, CC ;

FRITZSCHE, H .

SOLAR ENERGY MATERIALS, 1979, 1 (1-2) :29-42

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