X-RAY TOPOGRAPHIC OBSERVATIONS OF DISLOCATION ANNEALING AND OXIDATION IN BULK ZINC CRYSTALS

被引:7
|
作者
ROESSLER, B [1 ]
BURNS, SJ [1 ]
机构
[1] BROWN UNIV,DIV ENGN,PROVIDENCE,RI 02912
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 24卷 / 01期
关键词
D O I
10.1002/pssa.2210240125
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:285 / 298
页数:14
相关论文
共 50 条
  • [1] X-RAY TOPOGRAPHIC OBSERVATION OF DISLOCATION LOOP GROWTH IN BULK ZINC CRYSTALS
    BURNS, SJ
    ROESSLER, B
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 13 (02): : K91 - &
  • [2] X-Ray Topographic Images of Dislocation Loops in Crystals
    Novikov, S. M.
    Struk, A. Ya.
    Fodchuk, I. M.
    Fedortsov, D. G.
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2010, 32 (10): : 1325 - 1333
  • [4] X-RAY TOPOGRAPHIC IMAGES OF DISLOCATION LOOPS IN THIN SILICON CRYSTALS
    KAWADO, S
    MARUYAMA, T
    ISHII, Z
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S221 - S221
  • [5] X-ray scattering topographic observation of ZnSe and ZnTe bulk crystals
    Shinbara, M
    Suzuki, Y
    Chikaura, Y
    Kii, H
    JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) : 187 - 192
  • [6] Synchrotron x-ray topographic characterization of defects in InP bulk crystals
    Dhanaraj, G
    Raghothamachar, B
    Bai, J
    Chung, H
    Dudley, M
    2005 INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, 2005, : 643 - 648
  • [8] Synchrotron X-ray topographic analysis of dislocation structures in bulk SiC single crystal
    Yamaguchi, Satoshi
    Nakamura, Daisuke
    Gunjishima, Itaru
    Hirose, Yoshiharu
    SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 : 407 - +
  • [9] X-RAY TOPOGRAPHIC OBSERVATIONS OF DISLOCATION-FERROMAGNETIC DOMAIN INTERACTION IN FE-3 PERCENT SI CRYSTALS
    WU, CC
    ROESSLER, B
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 8 (02): : 571 - &
  • [10] X-RAY TOPOGRAPHIC OBSERVATION OF DISLOCATION MULTIPLICATION BY CROSS-SLIP IN CU CRYSTALS
    MINARI, F
    PICHAUD, B
    CAPELLA, L
    PHILOSOPHICAL MAGAZINE, 1975, 31 (02): : 275 - 284