REFINED STEP-RECOVERY TECHNIQUE FOR MEASURING MINORITY CARRIER LIFETIMES AND RELATED PARAMETERS IN ASYMMETRIC P-N JUNCTION DIODES

被引：51

作者：

DEAN, RH

NUESE, CJ

机构：

来源：

关键词：

D O I：

10.1109/T-ED.1971.17167

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：151 / &

共 12 条

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[8] NAKANO T, 1967, JAPAN J APPL PHYS, V10, P1212
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